Your Top 10 most-cited badge
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The article
Advanced platform for the in-plane ZT measurement of thin films
Vincent Linseis, F. Völklein, Heiko Reith, Kornelius Nielsch, Peter Woias
- Rank
- 8 of 1,307
- Percentile
- top 0.7%
- Where
- Review of Scientific Instruments, 2018
- Citations
- 86
From the 2018 list, OpenAlex counts as of 2026-10-29.
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