Your Top 50 most-cited badge
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The article
Impact of Process Variability on Write Error Rate and Read Disturbance in STT-MRAM Devices
Jeehwan Song, Hemant Dixit, Behtash Behin‐Aein, Chris H. Kim, William Taylor
- Rank
- 26 of 631
- Percentile
- top 4.2%
- Where
- IEEE Transactions on Magnetics, 2020
- Citations
- 45
From the 2020 list, OpenAlex counts as of 2026-10-29.
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