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The article

Study on Leakage Current Conduction Mechanism at high temperature in Al 2 O 3 /SiO 2 /n-type 4H-SiC MOS Capacitors

Atsushi Tamura

Rank
82 of 5,611
Percentile
top 1.5%
Where
The Japan Society of Applied Physics, 2019
Citations
0

From the 2019 list, OpenAlex counts as of 2026-10-29.

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