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The article
A comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures
K. Ganesan, Subrata Ghosh, Nanda Gopala Krishna, S. Ilango, M. Kamruddin, A. K. Tyagi
- Rank
- 42 of 3,578
- Percentile
- top 1.2%
- Where
- Physical Chemistry Chemical Physics, 2016
- Citations
- 182
From the 2016 list, OpenAlex counts as of 2026-10-29.
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