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The article
Technology and Reliability of Normally-Off GaN HEMTs with p-Type Gate
Matteo Meneghini, Oliver Hilt, Joachim Wuerfl, Gaudenzio Meneghesso
- Rank
- 46 of 2,202
- Percentile
- top 2.1%
- Where
- Energies, 2017
- Citations
- 173
From the 2017 list, OpenAlex counts as of 2026-10-29.
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