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The article
Proximity gettering of C 3 H 5 carbon cluster ion-implanted silicon wafers for CMOS image sensors: Gettering effects of transition metal, oxygen, and hydrogen impurities
Kazunari Kurita, Takeshi Kadono, Ryousuke Okuyama, Ryo Hirose, Ayumi Onaka‐Masada, Yoshihiro Koga and 1 more
- Rank
- 35 of 1,533
- Percentile
- top 2.3%
- Where
- Japanese Journal of Applied Physics, 2016
- Citations
- 51
From the 2016 list, OpenAlex counts as of 2026-10-29.
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