Your Top 50 most-cited badge
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The article
Threshold-voltage bias-temperature instability in commercially-available SiC MOSFETs
Ron Green, Aivars J. Lelis, Daniel B. Habersat
- Rank
- 17 of 1,533
- Percentile
- top 1.2%
- Where
- Japanese Journal of Applied Physics, 2016
- Citations
- 84
From the 2016 list, OpenAlex counts as of 2026-10-29.
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