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The article
Investigation of short-circuit failure mechanisms of SiC MOSFETs by varying DC bus voltage
Masaki Namai, Junjie An, Hiroshi Yano, Noriyuki Iwamuro
- Rank
- 29 of 1,406
- Percentile
- top 2.1%
- Where
- Japanese Journal of Applied Physics, 2018
- Citations
- 51
From the 2018 list, OpenAlex counts as of 2026-10-29.
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