Your Top 50 most-cited badge
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The article
Influence of silicon wafer surface roughness on semiconductor device characteristics
Keiichiro Mori, Shuichi Samata, Noritomo Mitsugi, Akinobu Teramoto, Rihito Kuroda, Tomoyuki Suwa and 2 more
- Rank
- 12 of 977
- Percentile
- top 1.3%
- Where
- Japanese Journal of Applied Physics, 2020
- Citations
- 44
From the 2020 list, OpenAlex counts as of 2026-10-29.
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