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The article

A design methodology for highly reliable operation for 2T0C dynamic random access memory application based on IGZO channel-all-around ferroelectric field-effect transistors

Jing Liang, Peng Yuan, Yong Yu, Jinjuan Xiang, Zhengyong Zhu, Menglong Zhou and 8 more

Rank
41 of 758
Percentile
top 5.5%
Where
Japanese Journal of Applied Physics, 2024
Citations
9

From the 2024 list, OpenAlex counts as of 2026-10-29.

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