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The article
Comparison of single Shockley-type stacking fault expansion rates in 4H-SiC under ultraviolet illumination after hydrogen or fluorine ion implantation
Johji Nishio, Chiharu Ota, Ryosuke Iijima
- Rank
- 22 of 758
- Percentile
- top 3%
- Where
- Japanese Journal of Applied Physics, 2024
- Citations
- 11
From the 2024 list, OpenAlex counts as of 2026-10-29.
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