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The article
Engineered interface charges and traps in GaN MOSFETs providing high channel mobility and E-mode operation
Tetsuo Narita, Kenji Ito, Hiroko Iguchi, Daigo Kikuta, Masakazu Kanechika, Kazuyoshi Tomita and 7 more
- Rank
- 21 of 758
- Percentile
- top 2.8%
- Where
- Japanese Journal of Applied Physics, 2024
- Citations
- 11
From the 2024 list, OpenAlex counts as of 2026-10-29.
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