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The article
Analysis of Interface Trap Densities for Al2O3 Dielectric Material Based Ultra Thin MOS Devices
N. P. Maity, Rajiv Ranjan Thakur, Reshmi Maity, Ram Kumar Thapa, Srimanta Baishya
- Rank
- 78 of 2,467
- Percentile
- top 3.2%
- Where
- Applied Mechanics and Materials, 2016
- Citations
- 12
From the 2016 list, OpenAlex counts as of 2026-10-29.
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