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The article

Threshold voltage instability by charge trapping effects in the gate region of p-GaN HEMTs

Giuseppe Greco, Patrick Fiorenza, Filippo Giannazzo, Corrado Bongiorno, Maurizio Moschetti, Cettina Bottari and 3 more

Rank
69 of 2,106
Percentile
top 3.3%
Where
Applied Physics Letters, 2022
Citations
46

From the 2022 list, OpenAlex counts as of 2026-10-29.

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