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The article
Study on the single-event burnout mechanism of p-GaN gate AlGaN/GaN HEMTs
Xiaohu Wang, Xuefeng Zheng, Danmei Lin, Hao Zhang, Yanrong Cao, Ling Lv and 5 more
- Rank
- 30 of 2,718
- Percentile
- top 1.2%
- Where
- Applied Physics Letters, 2024
- Citations
- 42
From the 2024 list, OpenAlex counts as of 2026-10-29.
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