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The article

Deep insights into the mechanism of nitrogen on the endurance enhancement in ferroelectric field effect transistors: Trap behavior during memory window degradation

Yuanquan Huang, Hongye Yuan, Bowen Nie, Tiancheng Gong, Yuan Wang, Shuxian Lv and 7 more

Rank
14 of 2,718
Percentile
top 0.6%
Where
Applied Physics Letters, 2024
Citations
56

From the 2024 list, OpenAlex counts as of 2026-10-29.

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