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The article
Unique Thickness-Dependent Properties of the van der Waals Interlayer Antiferromagnet MnBi 2 Te 4 Films
Mikhail M. Otrokov, I. P. Rusinov, M. Blanco-Rey, Martin W. G. Hoffmann, A. Yu. Vyazovskaya, Sergey V. Eremeev and 4 more
- Rank
- 13 of 2,723
- Percentile
- top 0.5%
- Where
- Physical Review Letters, 2019
- Citations
- 636
From the 2019 list, OpenAlex counts as of 2026-10-29.
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