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The article
Surface Defect Classification in Silicon Wafer Manufacturing Using the Linear-Based Channeling and Rule-Based Binning Algorithms
Hao Hu, K. Ullakko, Mingming Chao, Xin Lai
- Rank
- 8 of 82
- Percentile
- top 9.8%
- Where
- Advanced materials research, 2022
- Citations
- 9
From the 2022 list, OpenAlex counts as of 2026-10-29.
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