Your Top 50 most-cited badge
A badge for your website, a sentence for your CV, and a permanent page where anyone can check the rank.
The article
Growth of Shockley type stacking faults upon forward degradation in 4H-SiC p-i-n diodes
Atsushi Tanaka, Hirofumi Matsuhata, Naoyuki Kawabata, Daisuke Mori, Kei Inoue, Mina Ryo and 10 more
- Rank
- 39 of 2,368
- Percentile
- top 1.7%
- Where
- Journal of Applied Physics, 2016
- Citations
- 104
From the 2016 list, OpenAlex counts as of 2026-10-29.
Prefer not to be listed? The same link lets you withhold your name on every list; the article stays, your name does not. Questions: team@avidnote.com.