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The article
Short minority carrier lifetimes in highly nitrogen-doped 4H-SiC epilayers for suppression of the stacking fault formation in PiN diodes
T. Tawara, Tetsuya Miyazawa, Mina Ryo, Masaki Miyazato, T. Fujimoto, Kensuke Takenaka and 8 more
- Rank
- 31 of 2,368
- Percentile
- top 1.4%
- Where
- Journal of Applied Physics, 2016
- Citations
- 120
From the 2016 list, OpenAlex counts as of 2026-10-29.
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