Your Top 100 most-cited badge
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The article
Point defect reduction in MOCVD (Al)GaN by chemical potential control and a comprehensive model of C incorporation in GaN
Pramod Reddy, Shun Washiyama, Felix Kaess, Ronny Kirste, Seiji Mita, Ramón Collazo and 1 more
- Rank
- 100 of 2,289
- Percentile
- top 4.4%
- Where
- Journal of Applied Physics, 2017
- Citations
- 68
From the 2017 list, OpenAlex counts as of 2026-10-29.
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