Your Top 50 most-cited badge
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The article
A microscopic mechanism of dielectric breakdown in SiO2 films: An insight from multi-scale modeling
Andrea Padovani, David Zhe Gao, Alexander L. Shluger, Luca Larcher
- Rank
- 26 of 2,289
- Percentile
- top 1.2%
- Where
- Journal of Applied Physics, 2017
- Citations
- 130
From the 2017 list, OpenAlex counts as of 2026-10-29.
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