Your Top 10 most-cited badge
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The article
Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor
Christopher L. Holloway, Matthew T. Simons, Joshua A. Gordon, Andrew Dienstfrey, David Alexander Anderson, Georg A. Raithel
- Rank
- 7 of 2,289
- Percentile
- top 0.4%
- Where
- Journal of Applied Physics, 2017
- Citations
- 248
From the 2017 list, OpenAlex counts as of 2026-10-29.
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