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The article
Utility of Shockley–Read–Hall analysis to extract defect properties from semiconductor minority carrier lifetime data
Preston T. Webster, Rigo A. Carrasco, Alexander T. Newell, Julie V. Logan, Perry C. Grant, Diana Maestas and 1 more
- Rank
- 42 of 1,589
- Percentile
- top 2.7%
- Where
- Journal of Applied Physics, 2023
- Citations
- 32
From the 2023 list, OpenAlex counts as of 2026-10-29.
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